BH akademski imenik

An IDDQ BIST approach to characterize phase-locked loop parameters

29. 4. 2013.

7

Samed Maltabas, O. Ekekon, Kemal Kulovic, A. Meixner, M. Margala

IEEE VLSI Test Symposium

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2012 JETTA Reviewers

2013.

0

M. Aguirre, Z. Al-Ars, M. Alderighi, S. Almukhaizim, Himyanshu Anand, D. Appello, N. Axelos, J. Ayala, F. Azais et al.

Journal of electronic testing

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Design-for-test methodologies for current tests in Analog/Mixed-Signal Power SOCs

5. 9. 2012.

5

Kemal Kulovic, Samed Maltabas, M. Margala

Midwest Symposium on Circuits and Systems

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Novel Practical Built-in Current Sensors

21. 7. 2012.

0

Samed Maltabas, Kemal Kulovic, M. Margala

Journal of electronic testing

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Novel Practical Built-in Current Sensors

21. 7. 2012.

4

Samed Maltabas, Kemal Kulovic, M. Margala

Journal of electronic testing

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Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability

25. 5. 2012.

1

Kemal Kulovic, M. Margala

Journal of electronic testing

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Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability

25. 5. 2012.

0

Kemal Kulovic, M. Margala

Journal of electronic testing

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Built-in self-test methodologies for concurrent testing of analog/mixed-signal systems-on-chip

2012.

0

Kemal Kulovic

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Kemal Kulovic

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