Three families of Ni x Zr y (x = 28, 36, 38, x + y = 100%) metallic glasses were prepared and examined using X-ray, temperature dependent transport and magnetic field. X-ray characterization shows characteristic diffuse spectrum, except for narrow regions of control samples, where partial crystallization was induced in finite small volumes. Magnetic properties confirm spin-fluctuating paramagnetic-like behavior, which we asses from preliminary Hall coefficient measurements, which is quantitatively different in three sample families. Temperature dependent AC and DC transport measurements were conducted in a broad temperature range from 70 K to 700 K, finding both quantitative and semi-qualitative differences between samples with different Ni/Zr ratio.

The metallic glass ribbons of Ni36.5Zr63.5 were prepared by melt spinning. The samples have a large frozen-in structural disorder and in comparison with their crystalline state, a very high electrical resistivity. They are metastable and they relax structurally towards more stable state whenever atoms attain noticeable mobility. As the most structurally sensitive property the electrical resistivity of these samples was used to follow the relaxation process from room temperature to 673 K. To complete the investigation of structural relaxation the electrical resistance of as-quenched, annealed and about twenty years aged Ni36.5Zr63.5 samples was measured in the temperature range from 77 K to 275 K. The obtained results were presented graphically.

A new experimental technique was used for dilatometric measurements of Cu60Zr40 metallic glass samples under applied tensile stress. The measurements were performed on unrelaxed samples at 473K and gave a detailed insight into the low-temperature relaxation processes. The measurements indicate that the length change is a superposition of two competing processes: (i) low-temperature relaxation which is responsible for sample contraction and (ii) creep which leads to sample elongation. Using a special procedure they were able to discover the contribution of each of the above processes. On the basis of these data it was possible to evaluate the coefficient of viscosity as well as to find its dependence on the applied tensile stress.

The construction of a sample holder for the modified Seeman-Bohlin X-ray camera is described, which permits exposure of the samples in the temperature range 80-350K. Owing to the construction of the sample holder the position of the sample is always independent of its temperature. This keeps the sample in the position required by the geometry of the X-ray camera and its temperature can be changed precisely in the temperature range stated.