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Justine Barbot, Hee Eng Gek, Wilson Entalai Thomas Akin, Markus Peller, S. Franca, K. Bernert, H. Mähne, D. Lehninger, A. Viegas, K. Seidel
0 1. 3. 2026.

Ferroelectric HZO Capacitor on CoSi2 Electrode: Exploring CMOS-Compatible Alternative to TiN and W

Ferroelectric Capacitors (FeCAPs) based on HfZrO2 (HZO) are promising building blocks for ferroelectric (FE) Non-Volatile Memories (NVM). In this work, we investigate for the first time the deposition of FE HZO on top of epitaxial Cobalt Silicide (CoSi2), a mainstream CMOS material. While no systematic study exists on this combination, our preliminary results demonstrate the crystallization of the FE phase in HZO on CoSi2 and suggest pathways to improve FE performance to that of the reference stack TiN/HZO/TiN reported in this study and widely used in the literature.

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